IPM RAS / Structure / Staff / Pleshkov Roman

Pleshkov Roman

Junior research associate of the laboratory for the basics of the nanoelectronic component base of information technology (181)

Personal data

Born on 22 November, 1992 in Salgan (Nizhny Novgorod region)

Research interests

X-ray optics; physics of the surface and thin films; optical interferometry; x-ray sources; projection lithography

Education

  • 2011 — graduated from school № 47, Nizhni Novgorod
  • 2011−2017 — student of the physical department of Lobachevsky State University of Nizhni Novgorod (UNN)
  • 2015 — graduated from the bachelor course of UNN in the direction of «Electronics and Nanoelectronics»
  • 2017 — graduated from the magistracy of UNN in the direction of «Electronics and Nanoelectronics»
  • 2018 — Graduate School of IPM RAS

Publications

  1. Stable high-reflection Be/Mg multilayer mirrors for solar astronomy at 30.4 nm / V. N. Polkovnikov, N. I. Chkhalo, R. S. Pleshkov, N. N. Salashchenko, F. Schäfers, M. G. Sertsu, A. Sokolov, M. V. Svechnikov, and S. Yu. Zuev // Optics Letters, v.44. Iss.2. — Р. 263−266 (2019)
  2. Multi-layer mirrors Mo/Si with barrier layers B4C and Be / S. Yu. Zuev, D. E. Pariev, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, M. Sertsu, A. Sokolov, N. I. Chkhalo, F. Schaefers. // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techhigues. — № 3. — P. 5−9 (2019)
  3. Aperiodic mirrors on the basis of beryllium multilayer systems / S. A. Garakhin, S. Yu. Zuyev, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techhigues, № 4. — P. 3−8 (2019)
  4. A set of multilayer X-ray mirrors for a two-mirror monochromator in the wavelength range of 0.41 -15.5 nm / A. A. Akhsahalyan, Yu. A. Vainer, S. A. Garakhin, K. A. Elina, P. S. Zavertkin, S. Yu. Zuyev, D. V. Ivlyushkin, A. N. Nechay, A. D. Nikolenko, D. E. Pariev, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo // Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techhigues, № 1. — P. 14−21 (2019)

Contact detail

Phone.: +7 (831) 417−94−85 +127
E-mail: pleshkov@ipmras.ru

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