IPM RAS / Structure / Staff / Drozdov Mikhail

Drozdov Mikhail

Senior research associate of the Department for technology of nanostructures and devices, PhD in Physics.

Research interests

Semiconductor physics and analytical methods of the solid surface: Auger electron spectroscopy and secondary ion mass spectrometry. Recently, the main direction — setting and research of solid structures by time-of-flight secondary ion mass spectrometry to install TOF. SIMS-5.

Education

  • 1972 — 1977 — study in N. I. Lobachevsky State University of Nizhniy Novgorod.
  • 1979 — 1983 — post graduate study in IAP RAS;
  • 1987 — PhD in Physics (supervisor — A. M. Belyantsev).

Career

  • 1977 — 1993 — engineer, junior research associate, research associate of the IAP RAS;
  • 1994 — present — research associate, senior research associate of the IPM RAS;

Publications

  • S.S.Andreev, A. D. Akhsakhalyan, M. N. Drozdov, N. I. Polushkin, N. N. Salashchenko. High — resolution Auger depth profiling of multilayer structures Mo/Si, Mo/B4C, Ni/C. Thin Solid Films, 1995, v.263, p.169−174.
  • N.I.Polushkin, S. A. Gusev, M. N. Drozdov, Yu. K. Verevkin, V. N. Petryakov. Arrays of magnetic wires created in phase-separating Fe-containing alloys by interference laser irradiation. J. Appl. Phys., 1997, v.81, N8, p.5478.
  • M.N.Drozdov, S. V. Gaponov, S. A. Gusev, E. B. Kluenkov, V. I. Luchin, D. V. Masterov, S. K. Saykov, A. K. Vorobiev. Y-Ba-Cu-O thin film composition formation during magnetron sputtering. IEEE Trans. on Appl. Supercond. 1999, v.9, № 2, p.2371−2374.
  • V.A.Kurnaev, N. N. Trifonov, M. N. Drozdov, N. N. Salashchenko. «On the possibility of the in situ growth control and nondestructive depth profiling of ultrathin multilayer structures using keV hydrogen ions». Vacuum. 2000, Vol. 56, № 4, pp. 253−255 (2000).
  • Pakhomov G. L., Drozdov M. N., Vostokov N. V. Plasma irradiation effects in phthalocyanine films. Applied Surface Science, 2004, Volume/Issue 230/1−4, pp. 241−248.
  • G. L. Pakhomov, M. N. Drozdov, V. V. Travkin. SIMS study of gold/phthalocyanine interface. Applied Surface Science, 2010, v.256, pp.1946−1950.
  • E. Bulska, M. N. Drozdov, G. Mana, A. Pramann, O. Rienitz, P. Sennikov and S. Valkiers. The isotopic composition of enriched Si: a data analysis. Metrologia 48 (2011) S32-S36.
  • P.G. Sennikov, A. V. Vodopyanov, S. V. Golubev, D. A. Mansfeld, M. N. Drozdov, Yu. N. Drozdov, B. A. Andreev, L. V. Gavrilenko, D. A. Pryakhin, V. I. Shashkin, O. N. Godisov, A. I. Glasunov, A. Ju. Safonov, H.-J. Pohl, M. L. W. Thewalt, P. Becker, H. Riemannh, N. V. Abrosimov, S. Valkiers. Towards 0.99999 <28>Si. SolidStateCommunications. 2012, v.152, p.455−457.
  • B. Ber, P. Bábor, P. N. Brunkov, P. Chapon, M. N. Drozdov, R. Duda, D. Kazantsev, V. N. Polkovnikov, P. Yunin, A. Tolstogouzov. Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques. Thin Solid Films. 2013, V.540, P.96−105.
  • K.A. Arushanov, M. N. Drozdov, S. M. Karabanov, I. A. Zeltser, A. Tolstogouzov. TOF-SIMS study on surface modification of reed switch blades by pulsing nitrogen plasma. Applied Surface Science 2013, V.265, P.642- 647.
  • E. V. Salomatina, N. M. Bityurin, M. V. Gulenova, T. A. Gracheva, M. N. Drozdov, A. V. Knyazev, K. V. Kir’yanov, A. V. Markina and L. A. Smirnova. Synthesis, structure, and properties of organic-inorganic nanocomposites containing poly (titanium oxide). Journal of Materials Chemistry C, 2013, V. 39, N1, p.6375−6385.

Contact detail

Phone: +7 (831) 417−94−92

E-mail: drm@ipmras.ru

© 2000—2019, IPM RAS.
E-mail: director@ipmras.ru

Address: Academicheskaya Str., 7, Afonino, Nizhny Novgorod region, Kstovsky district, Kstovo region, 603087, Russia

Phone: +7 831 4179473,
Fax: +7 831 4179464,
Mail address: GSP-105, Nizhny Novgorod, 603950, Russia